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熔池结构对选区激光熔化316L不锈钢腐蚀行为的作用机理研究

Influence of Molten Pool Structure on Corrosion Behavior of Selective Laser Melted 316L Stainless Steel

  • 摘要: 熔池结构是激光增材制造的一个重要特征,同时也是引起SLM 316L不锈钢垂直加工方向(XOY面)和平行加工方向(XOZ面)的组织结构和性能上差异的重要原因。本文研究了熔池结构对选区激光熔化316L不锈钢腐蚀行为的作用机理,采用SEM、EBSD、TEM等材料表征手段,从不同尺度探究XOY面和XOZ面上熔池结构的差异,利用电化学测试、浸泡试验研究了XOY面和XOZ面的钝化行为和点蚀行为的差异。研究结果表明,XOY面上熔池结构沿着加工路径连续分布,熔池内部存在等轴/近等轴胞状亚结构,XOZ面上的熔池结构呈现连续鱼鳞状,熔池内部的胞状结构具有明显的取向性;在0.5M H2SO4溶液中恒电位成膜后,XOY面钝化膜上氧空位缺陷密度更小、电化学阻抗值更大、Cr2O3的相对含量更高,表现出比XOZ面具有更加优异的钝化行为;在酸性FeCl3溶液中浸泡12 h后,XOZ面上的最大点蚀坑深度为447.4 μm,约为XOY面的2倍,此外XOZ面圆形点蚀坑的边缘区域能够观察到点蚀坑延扇形熔池边界扩展的趋势。综合实验结果可知,XOY面上小尺寸的胞状亚结构促进钝化膜的生长,而XOZ面上的扇形熔池边界能够加速点蚀的扩展过程。

     

    Abstract: The molten pool structure is a critical feature of laser additive manufacturing and a key factor contributing to the differences in microstructures and properties between the vertical processing direction (XOY plane) and parallel processing direction (XOZ plane) of selective laser melted (SLM) 316L stainless steel. This study investigates the mechanism by which molten pool structures influence the corrosion behavior of SLM 316L stainless steel. Material characterization techniques, including SEM, EBSD, and TEM, were employed to analyze the differences in molten pool structures on the XOY and XOZ planes at different scales. Electrochemical tests and immersion experiments were conducted to evaluate the variations in passivation behavior and pitting resistance between the two planes. The results reveal that the molten pool structure on the XOY plane exhibits a continuous distribution along the processing path, with equiaxed/near-equiaxed cellular substructures inside the molten pools. In contrast, the XOZ plane displays a continuous fish-scale morphology of molten pools, with cellular substructures showing significant orientation dependence. After potentiostatic passivation in 0.5 M H?SO? solution, the passive film on the XOY plane exhibits a lower oxygen vacancy defect density, higher electrochemical impedance values, and a higher relative content of Cr?O?, indicating superior passivation behavior compared to the XOZ plane. Following 12 h of immersion in acidic FeCl? solution, the maximum pit depth on the XOZ plane reaches 447.4 μm, approximately twice that of the XOY plane. Additionally, the edge regions of circular pits on the XOZ plane demonstrate a tendency for pit propagation along the fan-shaped molten pool boundaries. These findings collectively suggest that the fine cellular substructures on the XOY plane promote passive film growth, while the fan-shaped molten pool boundaries on the XOZ plane accelerate pit propagation.

     

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