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BAO Xi-fang, XIE Yong-xu. Study on improving the straightness of tantalum wire[J]. Powder Metallurgy Technology, 2020, 38(5): 340-343, 349. DOI: 10.19591/j.cnki.cn11-1974/tf.2019070002
Citation: BAO Xi-fang, XIE Yong-xu. Study on improving the straightness of tantalum wire[J]. Powder Metallurgy Technology, 2020, 38(5): 340-343, 349. DOI: 10.19591/j.cnki.cn11-1974/tf.2019070002

Study on improving the straightness of tantalum wire

  • Capacitor-grade tantalum wire requires the higher straightness, the straightness of tantalum wire was improved by the doping of yttrium element in the tantalum raw materials and the thermal stress straightening method in this paper. The results show that, the microstructure, the recrystallization degree, and the mechanical properties of tantalum wire are improved by optimizing the payoff tension of continuous annealing, the wheel diameter of tap hole in continuous annealing, and the straightening coil diameter of tantalum wire. The purpose of improving tantalum straightness is achieved, and the applicability of the tantalum wire is improved.
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